Home / Products / Integrated Circuits (ICs) / Logic - Specialty Logic / SN74BCT8244ADWR
Manufacturer Part Number | SN74BCT8244ADWR |
---|---|
Future Part Number | FT-SN74BCT8244ADWR |
SPQ / MOQ | Contact Us |
Packing Material | Reel/Tray/Tube/Others |
Series | 74BCT |
SN74BCT8244ADWR Status (Lifecycle) | In Stock |
Part Status | Discontinued at Future Semiconductor |
Logic Type | Scan Test Device with Buffers |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |
Country of Origin | USA/JAPAN/MALAYSIA/MEXICO/CN |
SN74BCT8244ADWR Weight | Contact Us |
Replacement Part Number | SN74BCT8244ADWR-FT |
SSTV16857CGLNT
IDT, Integrated Device Technology Inc
SSTV16857CGT
IDT, Integrated Device Technology Inc
SSTV16857DGG,112
NXP USA Inc.
SSTV16857DGG,118
NXP USA Inc.
SSTV16857DGG,512
NXP USA Inc.
SSTV16857DGG,518
NXP USA Inc.
SSTV16857DGV,112
NXP USA Inc.
SSTV16857DGV,118
NXP USA Inc.
SSTVA16857AG
IDT, Integrated Device Technology Inc
SSTVA16857AGLF
IDT, Integrated Device Technology Inc
XC3S200A-5VQ100C
Xilinx Inc.
M2GL050T-1FGG484
Microsemi Corporation
LFE2-70SE-7F900C
Lattice Semiconductor Corporation
5SGXEA4K3F40I3LN
Intel
EP4SGX360FH29I3N
Intel
5SGSED6N2F45C3N
Intel
XA7A100T-2CSG324I
Xilinx Inc.
A40MX04-1PQG100
Microsemi Corporation
LFEC10E-4FN484I
Lattice Semiconductor Corporation
10AX115S4F45I3LG
Intel